Scanning Electron Microscopy Laboratory

 

The JSM-7001F is a Field Emission – Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun equipped with a large, 5-axis, fully eccentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage.

 

SEM

Resolution (secondary electron image)

1.2 nm (at 30 kV)

3.0 nm (at 1.0 kV)

3.0 nm (at 15 kV 10mm WD, 5nA)

Accelerating Voltage

0.5 to 2.9 kV (10V steps)

3.0 to 30 kV (100V steps)

Magnification

x10 to x1,000,000

Imaging Modes

SEI (secondary electron image)

BEI (backscattered electron image TOPO and COMPO)

Other analytical techniques

EDXS (Energy Dispersive X-ray Spectroscopy)

Coating system and other SEM sample preparation tecniques are suitable.

 

 

SEM Documentation